Characterization of charged defects in CdxHg1-xTe and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy

  1. Panin, G.
  2. Díaz-Guerra, C.
  3. Piqueras, J.
Aldizkaria:
Applied Physics Letters

ISSN: 0003-6951

Argitalpen urtea: 1998

Alea: 72

Zenbakia: 17

Orrialdeak: 2129-2131

Mota: Artikulua

DOI: 10.1063/1.121298 GOOGLE SCHOLAR
Datuen iturria: Scopus