Characterization of charged defects in CdxHg1-xTe and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
- Panin, G.
- Díaz-Guerra, C.
- Piqueras, J.
ISSN: 0003-6951
Année de publication: 1998
Volumen: 72
Número: 17
Pages: 2129-2131
Type: Article