Electron beam induced current and scanning tunnelling spectroscopy correlative study of CdxHg1-xTe and CdTe crystals

  1. Panin, G.N.
  2. Díaz-Guerra, C.
  3. Piqueras, J.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 1998

Volumen: 13

Número: 6

Pages: 576-582

Type: Article

DOI: 10.1088/0268-1242/13/6/007 GOOGLE SCHOLAR

Objectifs de Développement Durable