Raman and rutherford backscattering characterization of Ti implanted Si above Mott limit
- Olea, J.
- Pastor, D.
- Mártil, I.
- González-Díaz, G.
- Ibáñez, J.
- Cuscó, R.
- Artús, L.
ISSN: 0272-9172
ISBN: 9781605111834
Year of publication: 2010
Volume: 1210
Pages: 93-98
Type: Conference paper