Electrical characterization of Al/SiNx:H/n and p-In0.53Ga0.47As structures by deep-level transient spectroscopy and conductance transient techniques
- Castán, H.
- Dueñas, S.
- Barbolla, J.
- Blanco, N.
- Mártil, I.
- González-Díaz, G.
ISSN: 0021-4922
Argitalpen urtea: 2001
Alea: 40
Zenbakia: 7
Orrialdeak: 4479-4484
Mota: Artikulua