Electrical characterization of Si+ and Si+/P+ implanted N+P In0.53Ga0.47As junctions

  1. Blanco, M.N.
  2. Redondo, E.
  3. León, C.
  4. Santamaria, J.
  5. González-Diaz, G.
Aldizkaria:
Journal of Materials Science: Materials in Electronics

ISSN: 0957-4522

Argitalpen urtea: 1999

Alea: 10

Zenbakia: 5

Orrialdeak: 425-428

Mota: Artikulua

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Datuen iturria: Scopus