Conductance transients study of slow traps in Al/SiNx:H/Si and Al/SiNx:H/InP metal-insulator-semiconductor structures
- Duenas, S.
- Pelaez, R.
- Castan, E.
- Barbolla, J.
- Martil, I.
- Gonzalez-Diaz, G.
Proceedings:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Year of publication: 1998
Volume: 500
Pages: 87-92
Type: Conference paper