Native and irradiation-induced defects in SiO2 structures studied by positron annihilation techniques

1. Rivera, A.
2. Montilla, I.
3. Alba García, A.
4. Galindo, R.E.
5. Falub, C.V.
6. Van Veen, A.
7. Schut, H.
8. De Nijs, J.M.M.
9. Balk, P.