Native and irradiation-induced defects in SiO2 structures studied by positron annihilation techniques
- Rivera, A.
- Montilla, I.
- Alba García, A.
- Galindo, R.E.
- Falub, C.V.
- Van Veen, A.
- Schut, H.
- De Nijs, J.M.M.
- Balk, P.
ISSN: 0255-5476
Year of publication: 2001
Volume: 363-365
Pages: 64-66
Type: Conference paper