Study of ion-implantation damage in GaAs:Be and InP:Be using Raman scattering
- Rao, C.S.R.
- Sundaram, S.
- Schmidt, R.L.
- Comas, J.
ISSN: 0021-8979
Year of publication: 1983
Volume: 54
Issue: 4
Pages: 1808-1815
Type: Article
ISSN: 0021-8979
Year of publication: 1983
Volume: 54
Issue: 4
Pages: 1808-1815
Type: Article