Atomic-scale studies of complex oxide interfaces using aberration-corrected Z-contrast imaging and EELS

  1. Klie, R.F.
  2. Schofield, M.A.
  3. Varela, M.
  4. Pennycook, S.J.
  5. Bleloch, A.
  6. Zhu, Y.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Year of publication: 2006

Volume: 12

Issue: SUPPL. 2

Pages: 112-113

Type: Conference paper

DOI: 10.1017/S1431927606062052 GOOGLE SCHOLAR
Data source: Scopus