Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns

  1. Carreño, F.
  2. Bernabeu, E.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9780819417060

Year of publication: 1995

Volume: 2208

Pages: 77-87

Type: Conference paper

DOI: 10.1117/12.213171 GOOGLE SCHOLAR
Data source: Scopus