Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns

  1. Carreño, F.
  2. Bernabeu, E.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9780819417060

Année de publication: 1995

Volumen: 2208

Pages: 77-87

Type: Communication dans un congrès

DOI: 10.1117/12.213171 GOOGLE SCHOLAR
La source de données: Scopus