Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns

  1. Carreño, F.
  2. Bernabeu, E.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9780819417060

Ano de publicación: 1995

Volume: 2208

Páxinas: 77-87

Tipo: Achega congreso

DOI: 10.1117/12.213171 GOOGLE SCHOLAR
Fonte de datos: Scopus