Determination of optical parameters in general film-substrate systems: A reformulation based on the concepts of envelope extremes and local magnitudes

  1. Martínez-Antón, J.C.
Aldizkaria:
Applied Optics

ISSN: 2155-3165,  1559-128X

Argitalpen urtea: 2000

Alea: 39

Zenbakia: 25

Orrialdeak: 4557-4568

Mota: Artikulua

DOI: 10.1364/AO.39.004557 GOOGLE SCHOLAR
Datuen iturria: Scopus