Determination of optical parameters in general film-substrate systems: A reformulation based on the concepts of envelope extremes and local magnitudes

  1. Martínez-Antón, J.C.
Revue:
Applied Optics

ISSN: 2155-3165,  1559-128X

Année de publication: 2000

Volumen: 39

Número: 25

Pages: 4557-4568

Type: Article

DOI: 10.1364/AO.39.004557 GOOGLE SCHOLAR
La source de données: Scopus