Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets

  1. Ramezani, R.
  2. Clemente, J.A.
  3. Franco, F.J.
Zeitschrift:
Reliability Engineering and System Safety

ISSN: 0951-8320

Datum der Publikation: 2020

Ausgabe: 202

Art: Artikel

DOI: 10.1016/J.RESS.2020.107036 GOOGLE SCHOLAR
Datenquelle: Scopus