Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets
- Ramezani, R.
- Clemente, J.A.
- Franco, F.J.
Aldizkaria:
Reliability Engineering and System Safety
ISSN: 0951-8320
Argitalpen urtea: 2020
Alea: 202
Mota: Artikulua