Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets

  1. Ramezani, R.
  2. Clemente, J.A.
  3. Franco, F.J.
Journal:
Reliability Engineering and System Safety

ISSN: 0951-8320

Year of publication: 2020

Volume: 202

Type: Article

DOI: 10.1016/J.RESS.2020.107036 GOOGLE SCHOLAR
Data source: Scopus