Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Martín, N.
  4. Pardo, L.
Revue:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Année de publication: 2020

Volumen: 36

Número: 6

Pages: 1916-1930

Type: Article

DOI: 10.1002/QRE.2665 GOOGLE SCHOLAR
La source de données: Scopus