Particle alignment reliability in single particle electron cryomicroscopy: A general approach
- Vargas, J.
- Otón, J.
- Marabini, R.
- Carazo, J.M.
- Sorzano, C.O.S.
Journal:
Scientific Reports
ISSN: 2045-2322
Year of publication: 2016
Volume: 6
Type: Article