Particle alignment reliability in single particle electron cryomicroscopy: A general approach

  1. Vargas, J.
  2. Otón, J.
  3. Marabini, R.
  4. Carazo, J.M.
  5. Sorzano, C.O.S.
Aldizkaria:
Scientific Reports

ISSN: 2045-2322

Argitalpen urtea: 2016

Alea: 6

Mota: Artikulua

DOI: 10.1038/SREP21626 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus