Particle alignment reliability in single particle electron cryomicroscopy: A general approach

  1. Vargas, J.
  2. Otón, J.
  3. Marabini, R.
  4. Carazo, J.M.
  5. Sorzano, C.O.S.
Revue:
Scientific Reports

ISSN: 2045-2322

Année de publication: 2016

Volumen: 6

Type: Article

DOI: 10.1038/SREP21626 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus