Defect Detection from Multi-frequency Limited Data via Topological Sensitivity
- Funes, J.F.
- Perales, J.M.
- Rapún, M.-L.
- Vega, J.M.
ISSN: 1573-7683, 0924-9907
Year of publication: 2016
Volume: 55
Issue: 1
Pages: 19-35
Type: Article
ISSN: 1573-7683, 0924-9907
Year of publication: 2016
Volume: 55
Issue: 1
Pages: 19-35
Type: Article