Defect Detection from Multi-frequency Limited Data via Topological Sensitivity

  1. Funes, J.F.
  2. Perales, J.M.
  3. Rapún, M.-L.
  4. Vega, J.M.
Aldizkaria:
Journal of Mathematical Imaging and Vision

ISSN: 1573-7683,  0924-9907

Argitalpen urtea: 2016

Alea: 55

Zenbakia: 1

Orrialdeak: 19-35

Mota: Artikulua

DOI: 10.1007/S10851-015-0611-Y GOOGLE SCHOLAR
Datuen iturria: Scopus