Seu and Sefi error detection and correction on a ddr3 memory system

  1. Cóbreces, A.
  2. Regadío, A.
  3. Tabero, J.
  4. Reviriego, P.
  5. Sánchez-Macian, A.
  6. Maestro, J.A.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2018

Volume: 91

Pages: 23-30

Type: Article

DOI: 10.1016/J.MICROREL.2018.08.002 GOOGLE SCHOLAR
Data source: Scopus