Efficient majority logic fault detection with difference-set codes for memory applications

  1. Liu, S.-F.
  2. Reviriego, P.
  3. Maestro, J.A.
Aldizkaria:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Argitalpen urtea: 2012

Alea: 20

Zenbakia: 1

Orrialdeak: 148-156

Mota: Artikulua

DOI: 10.1109/TVLSI.2010.2091432 GOOGLE SCHOLAR
Datuen iturria: Scopus