Efficient majority logic fault detection with difference-set codes for memory applications

  1. Liu, S.-F.
  2. Reviriego, P.
  3. Maestro, J.A.
Revue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Année de publication: 2012

Volumen: 20

Número: 1

Pages: 148-156

Type: Article

DOI: 10.1109/TVLSI.2010.2091432 GOOGLE SCHOLAR
La source de données: Scopus