Validation and optimization of TMR protections for circuits in radiation environments
- Ruano, O.
- Maestro, J.A.
- Reviriego, P.
Konferenzberichte:
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011
ISBN: 9781424497560
Datum der Publikation: 2011
Seiten: 399-400
Art: Konferenz-Beitrag