Validation and optimization of TMR protections for circuits in radiation environments

  1. Ruano, O.
  2. Maestro, J.A.
  3. Reviriego, P.
Konferenzberichte:
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011

ISBN: 9781424497560

Datum der Publikation: 2011

Seiten: 399-400

Art: Konferenz-Beitrag

DOI: 10.1109/DDECS.2011.5783120 GOOGLE SCHOLAR