Validation and optimization of TMR protections for circuits in radiation environments
- Ruano, O.
- Maestro, J.A.
- Reviriego, P.
Proceedings:
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011
ISBN: 9781424497560
Year of publication: 2011
Pages: 399-400
Type: Conference paper