A methodology for automatic insertion of selective TMR in digital circuits affected by SEUs

  1. Ruano, O.
  2. Maestro, J.A.
  3. Reviriego, P.
Journal:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Year of publication: 2009

Volume: 56

Issue: 4

Pages: 2091-2102

Type: Conference paper

DOI: 10.1109/TNS.2009.2014563 GOOGLE SCHOLAR
Data source: Scopus