Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

  1. Rodríguez, T.R.
  2. García, R.
Aldizkaria:
Applied Physics Letters

ISSN: 0003-6951

Argitalpen urtea: 2004

Alea: 84

Zenbakia: 3

Orrialdeak: 449-451

Mota: Artikulua

DOI: 10.1063/1.1642273 GOOGLE SCHOLAR