Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

  1. Rodríguez, T.R.
  2. García, R.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2004

Volumen: 84

Número: 3

Pages: 449-451

Type: Article

DOI: 10.1063/1.1642273 GOOGLE SCHOLAR
La source de données: Scopus