SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

  1. Fabero, J.C.
  2. Korkian, G.
  3. Franco, F.J.
  4. Hubert, G.
  5. Mecha, H.
  6. Letiche, M.
  7. Clemente, J.A.
Zeitschrift:
Microprocessors and Microsystems

ISSN: 0141-9331

Datum der Publikation: 2023

Ausgabe: 96

Art: Artikel

DOI: 10.1016/J.MICPRO.2022.104743 GOOGLE SCHOLAR lock_openOpen Access editor
Datenquelle: Scopus