SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

  1. Fabero, J.C.
  2. Korkian, G.
  3. Franco, F.J.
  4. Hubert, G.
  5. Mecha, H.
  6. Letiche, M.
  7. Clemente, J.A.
Revue:
Microprocessors and Microsystems

ISSN: 0141-9331

Année de publication: 2023

Volumen: 96

Type: Article

DOI: 10.1016/J.MICPRO.2022.104743 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus