High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds

  1. Vila, M.
  2. Prieto, C.
  3. Miranzo, P.
  4. Osendi, M.I.
  5. Terry, A.E.
  6. Vaughan, G.B.M.
Revista:
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

ISSN: 0168-583X

Ano de publicación: 2005

Volume: 238

Número: 1-4

Páxinas: 119-123

Tipo: Achega congreso

DOI: 10.1016/J.NIMB.2005.06.030 GOOGLE SCHOLAR

Obxectivos de Desenvolvemento Sustentable

Fonte de datos: Scopus