Experimental determination of residual stress in silicon nitride diffusion bonds obtained by high-energy X-ray diffraction

  1. Vila, M.
  2. Martínez, M.L.
  3. Prieto, C.
  4. Miranzo, P.
  5. Osendi, M.I.
  6. Terry, A.
  7. Vaughan, G.
Journal:
Powder Technology

ISSN: 0032-5910

Year of publication: 2004

Volume: 148

Issue: 1

Pages: 60-63

Type: Conference paper

DOI: 10.1016/J.POWTEC.2004.09.035 GOOGLE SCHOLAR
Data source: Scopus