Framework-supported mechanism of testing algorithms for assessing memory and detecting disorientation from IoT sensors
- Garcia-Magarino, Ivan
- Cardenas, Marlon
- Gomez-Sanz, Jorge
- Perez Diez, Juan L.
ISBN: 978-1-5386-4980-0
Datum der Publikation: 2019
Seiten: 899-904
Kongress: 5th IEEE World Forum on Internet of Things (IEEE WF-IoT)
Art: Konferenz-Beitrag