Framework-supported mechanism of testing algorithms for assessing memory and detecting disorientation from IoT sensors
- Garcia-Magarino, Ivan
- Cardenas, Marlon
- Gomez-Sanz, Jorge
- Perez Diez, Juan L.
ISBN: 978-1-5386-4980-0
Année de publication: 2019
Pages: 899-904
Congreso: 5th IEEE World Forum on Internet of Things (IEEE WF-IoT)
Type: Communication dans un congrès