High-level allocation to minimize internal hardware wastage

  1. Molina, MC
  2. Mendias, JM
  3. Hermida, R
Buch:
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS

ISBN: 0-7695-1870-2

Datum der Publikation: 2003

Seiten: 264-269

Kongress: Design, Automation and Test in Europe Conference and Exhibition (DATE 03)

Art: Konferenz-Beitrag

GOOGLE SCHOLAR
Fuente de los datos: WoS