High-level allocation to minimize internal hardware wastage

  1. Molina, MC
  2. Mendias, JM
  3. Hermida, R
Liburua:
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS

ISBN: 0-7695-1870-2

Argitalpen urtea: 2003

Orrialdeak: 264-269

Biltzarra: Design, Automation and Test in Europe Conference and Exhibition (DATE 03)

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS