Phase separation in reduced LiNbO3

  1. Bazhenov, A
  2. Shmyt'ko, I
  3. Red'kin, B
  4. Vieira, S
  5. Enciso, E
Book Series:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997
  1. Donecker, J (coord.)
  2. Rechenberg, I (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0500-2

Year of publication: 1998

Volume: 160

Pages: 425-428

Congress: 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP-VII)

Type: Conference paper

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Data source: WoS