Phase separation in reduced LiNbO3

  1. Bazhenov, A
  2. Shmyt'ko, I
  3. Red'kin, B
  4. Vieira, S
  5. Enciso, E
Collection de livres:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997
  1. Donecker, J (coord.)
  2. Rechenberg, I (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0500-2

Année de publication: 1998

Volumen: 160

Pages: 425-428

Congreso: 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP-VII)

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: WoS