Phase separation in reduced LiNbO3

  1. Bazhenov, A
  2. Shmyt'ko, I
  3. Red'kin, B
  4. Vieira, S
  5. Enciso, E
Colección de libros:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997
  1. Donecker, J (coord.)
  2. Rechenberg, I (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0500-2

Ano de publicación: 1998

Volume: 160

Páxinas: 425-428

Congreso: 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP-VII)

Tipo: Achega congreso

GOOGLE SCHOLAR
Fonte de datos: WoS