Noise studies of driven geometric phase gates with trapped ions

  1. Lemmer, A.
  2. Plenio, M. B.
  3. Bermudez, A.
Book Series:
ION TRAPS FOR TOMORROW'S APPLICATIONS
  1. Knoop, M (coord.)
  2. Marzoli, I (coord.)
  3. Morigi, G (coord.)

ISSN: 0074-784X

ISBN: 978-1-61499-526-5,  978-1-61499-525-8

Year of publication: 2015

Volume: 189

Pages: 229-244

Congress: 189th International-School-of-Physics-Enrico-Fermi-of-the-Italian-Physical-Society on Ion Traps for Tomorrow's Applications

Type: Conference paper

DOI: 10.3254/978-1-61499-526-5-229 GOOGLE SCHOLAR

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Data source: WoS