Noise studies of driven geometric phase gates with trapped ions

  1. Lemmer, A.
  2. Plenio, M. B.
  3. Bermudez, A.
Liburu bilduma:
ION TRAPS FOR TOMORROW'S APPLICATIONS
  1. Knoop, M (coord.)
  2. Marzoli, I (coord.)
  3. Morigi, G (coord.)

ISSN: 0074-784X

ISBN: 978-1-61499-526-5,  978-1-61499-525-8

Argitalpen urtea: 2015

Alea: 189

Orrialdeak: 229-244

Biltzarra: 189th International-School-of-Physics-Enrico-Fermi-of-the-Italian-Physical-Society on Ion Traps for Tomorrow's Applications

Mota: Biltzar ekarpena

DOI: 10.3254/978-1-61499-526-5-229 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: WoS