High-resolution transmission electron microscopic analysis of porous silicon/silicon interface
- Martín-Palma, R.J.
- Pascual, L.
- Landa, A.
- Herrero, P.
- Martínez-Duart, J.M.
ISSN: 0003-6951
Year of publication: 2004
Volume: 85
Issue: 13
Pages: 2517-2519
Type: Article