High-resolution transmission electron microscopic analysis of porous silicon/silicon interface

  1. Martín-Palma, R.J.
  2. Pascual, L.
  3. Landa, A.
  4. Herrero, P.
  5. Martínez-Duart, J.M.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2004

Volumen: 85

Número: 13

Pages: 2517-2519

Type: Article

DOI: 10.1063/1.1797558 GOOGLE SCHOLAR
La source de données: Scopus