ENRIQUE
SAN ANDRÉS SERRANO
Catedrático de universidad
Liverpool John Moores University
Liverpool, Reino UnidoPublicaciones en colaboración con investigadores/as de Liverpool John Moores University (2)
2007
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Advanced electrical characterization toward (sub) 1nm EOT HfSiON - Hole trapping in PFET and L-dependent effects
Digest of Technical Papers - Symposium on VLSI Technology
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Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
Microelectronic Engineering, Vol. 84, Núm. 9-10, pp. 1943-1946