Publicacións en colaboración con investigadores/as de Center for Physical Sciences and Technology (2)

2002

  1. Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies

    IEEE Transactions on Instrumentation and Measurement, Vol. 51, Núm. 4, pp. 650-655

2001

  1. Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques

    Conference Record - IEEE Instrumentation and Measurement Technology Conference, Vol. 1, pp. 530-533